The microstructure and dielectric properties of manganese-doped zinc titanate (MnxZn1–xTiO3) ceramic samples were investigated as a function of manganese concentration (x = 0.1; 0.3, & 0.5). XRD analysis confirmed that the samples exhibited an ilmenite hexagonal structure, indicating the structural evolution of the material. The dielectric constant was influenced by the Mn content and increased with increasing temperature and decreased with increasing frequency. According to the findings, the dielectric loss and dielectric constant increased with temperature and decreased with frequency. The addition of trace amounts of zinc to the manganese titanate ceramics resulted in a substantial increase in the dielectric constant. The substitution of zinc ions for manganese ions effectively enhanced the dielectric properties of the ceramic samples, which highlights their potential for advanced applications.
